The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 26, 2023
Filed:
Jan. 19, 2022
Daylight Solutions, Inc., San Diego, CA (US);
Miles James Weida, Poway, CA (US);
Timothy Day, Poway, CA (US);
DAYLIGHT SOLUTIONS, INC., San Diego, CA (US);
Abstract
An imaging microscope () for generating an image of a sample () comprises a beam source () that emits a temporally coherent illumination beam (), the illumination beam () including a plurality of rays that are directed at the sample (); an image sensor () that converts an optical image into an array of electronic signals; and an imaging lens assembly () that receives rays from the beam source () that are transmitted through the sample () and forms an image on the image sensor (). The imaging lens assembly () can further receive rays from the beam source () that are reflected off of the sample () and form a second image on the image sensor (). The imaging lens assembly () receives the rays from the sample () and forms the image on the image sensor () without splitting and recombining the rays.