The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2023

Filed:

Feb. 15, 2022
Applicant:

Stmicroelectronics S.r.l., Agrate Brianza, IT;

Inventors:

Carlo Caimi, Cinisello Balsamo, IT;

Massimiliano Pesaturo, Torre de' Roveri, IT;

Stefano Antonio Mastrorosa, Milan, IT;

Alfredo Lorenzo Poli, Pontida, IT;

Marco Della Seta, Milan, IT;

Assignee:

STMICROELECTRONICS S.R.L., Agrate Brianza, IT;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/00 (2006.01); G01R 31/317 (2006.01); G01R 31/3187 (2006.01); G01R 31/3185 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2856 (2013.01); G01R 31/007 (2013.01); G01R 31/3187 (2013.01); G01R 31/31703 (2013.01); G01R 31/31724 (2013.01); G01R 31/318525 (2013.01);
Abstract

An integrated circuit includes a sub-system and a reference sub-system. The reference sub-system is substantially identical to the sub-system but is non-operating by default. The integrated circuit includes a test circuit that obtains a parameter value of the sub-system and a reference parameter from the reference sub-system. The integrated circuit detects deterioration of the sub-system based on the parameter value and the reference parameter. The integrated circuit deactivates the sub-system and activates the reference sub-system responsive to detecting deterioration of the sub-system.


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