The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2023

Filed:

Mar. 26, 2021
Applicant:

Point Engineering Co., Ltd., Asan-si, KR;

Inventors:

Bum Mo Ahn, Suwon-si, KR;

Seung Ho Park, Hwaseong-si, KR;

Tae Hwan Song, Cheonan-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/073 (2006.01);
U.S. Cl.
CPC ...
G01R 1/07342 (2013.01);
Abstract

Proposed is a probe head having a probe card for performing a circuit inspection of a wafer. More particularly, proposed are a probe head and a probe card having the probe head, the probe head having a guide plate. The guide plate has a guide hole and a shield portion composed of a metal material positioned at the periphery of the guide hole, thereby blocking signal interference that may be occurred between adjacent probes.


Find Patent Forward Citations

Ahn, Bum. (2023). Probe head and probe card having same (U.S. Patent No. 11852656). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11852656

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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