The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2023

Filed:

Apr. 22, 2019
Applicant:

Yokogawa Electric Corporation, Tokyo, JP;

Inventor:

Takayuki Kei, Musashino, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/10 (2006.01);
U.S. Cl.
CPC ...
G01N 35/1072 (2013.01); G01N 2035/103 (2013.01);
Abstract

A sample analysis support apparatus includes a sample region in which a sample is to be disposed, a tip region in which a tip is to be disposed, a first operation unit capable of an operation on the sample using the tip, the tip being attachable to and detachable from the first operation unit, a second operation unit capable of an operation on the sample using the tip, the tip being attachable to and detachable from the second operation unit, a transport unit configured to support each of the first operation unit and the second operation unit moveably between the tip region and the sample region, and a movement controller capable of controlling the transport unit to move each of the first operation unit and the second operation unit between the tip region and the sample region.


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