The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 26, 2023
Filed:
Jun. 10, 2019
Shimadzu Corporation, Kyoto, JP;
Tohru Matsuura, Kyoto, JP;
SHIMADZU CORPORATION, Kyoto, JP;
Abstract
Provided is a material testing machine () including: a load mechanism () that applies a load to a test object; a load measurement device that measures the load applied to the test object; and a control device () that performs a feedback control for the load mechanism () based on a deviation between a measurement value of the load and a target value of the load, in which a change in a physical quantity generated in the test object due to the load is measured, and the control device () includes a hunting detection unit () that detects hunting by comparing a frequency spectrum obtained by converting time-series data of the measurement value with a frequency spectrum obtained by converting the time-series data of the target value.