The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2023

Filed:

Apr. 11, 2019
Applicant:

Maillefer S.a., Ecublens, CH;

Inventors:

Janne Harjuhahto, Vantaa, FI;

Jaakko Harjuhahto, Porvoo, FI;

Assignee:

Maillefer S.A., Ecublens, CH;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/952 (2006.01); G01B 11/02 (2006.01); G01B 11/24 (2006.01); G01B 11/30 (2006.01); G06N 3/08 (2023.01); H01B 13/14 (2006.01); H01B 13/24 (2006.01);
U.S. Cl.
CPC ...
G01N 21/952 (2013.01); G01B 11/026 (2013.01); G01B 11/2408 (2013.01); G01B 11/303 (2013.01); G01B 11/306 (2013.01); G06N 3/08 (2013.01); H01B 13/14 (2013.01); H01B 13/24 (2013.01); G01N 2201/06113 (2013.01);
Abstract

A surface scanner for surface defect detection of a cable comprises a measuring part and an analysis part, the measuring part comprises non-contact distance measurement sensors, the cable is positionable between the sensors such that beams of the sensors are directable to the outer surface of the cable to sample areas at a circumference of the cable for a length of the outer surface (L) of the cable in a run direction (x) of the cable for providing measurement data, and the analysis part comprises a receiver for the measurement data, a processor for processing the measurement data providing defect detection data and a continuous 3D topographic map of the outer surface of the cable, the analysis part comprising a neural network trained for detecting surface defects of the cable and outputting surface defects detection data. The invention also relates to an arrangement and a method for surface defect detection of a cable.


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