The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 26, 2023
Filed:
Feb. 25, 2020
Omron Corporation, Kyoto, JP;
Yosuke Naruse, Uji, JP;
OMRON Corporation, Kyoto, JP;
Abstract
This inspection device comprises: image-capturing unit obtaining an evaluation workpiece image that is captured with a plurality of predetermined illumination light emission patterns; image area setting unit setting a plurality of image areas associated with a plurality of different labels; optimization calculation unit generating a first index of which the output value increases as a difference between an image area associated with a non-defective label and a defective label increases, and a second index of which the output value increases as a difference or contrast between the image areas associated with the non-defective label increases, and calculates an illumination light emission pattern for inspection such that the first index becomes larger and the second index becomes smaller; and determination unit performing image processing on an inspection workpiece image captured with the illumination light emission pattern for inspection, and determines a pass/fail label of a workpiece to be inspected.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile