The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2023

Filed:

Mar. 01, 2022
Applicant:

Adva Optical Networking SE, Meiningen, DE;

Inventor:

Michael Eiselt, Kirchheim, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 5/353 (2006.01); G01K 11/32 (2021.01);
U.S. Cl.
CPC ...
G01D 5/35329 (2013.01); G01K 11/32 (2013.01);
Abstract

In a method for interrogating at least one optical sensor coupled to an optical path, at least two time-shifted optical signals are fed into the optical path and reflected optical signals of the at least two probe signals created by the at least one optical sensor are detected. Each detected reflected optical signal is assigned to one of the at least one optical sensor and a correct optical frequency is assigned to each detected reflected optical signal. An absolute value or a value range or a change of a value or value range of the parameter to be sensed is determined from the one or more of the following physical conditions: the optical reflection signals, the reflectivity of the at least one optical sensor, and the frequency of each detected optical reflection signal, or from one or more dependencies that link these physical conditions.


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