The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2023

Filed:

Dec. 20, 2021
Applicant:

GM Global Technology Operations Llc, Detroit, MI (US);

Inventors:

Fang Dai, Troy, MI (US);

Hongliang Wang, Sparks, NV (US);

Shuru Chen, Troy, MI (US);

Mei Cai, Bloomfield Hills, MI (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/06 (2006.01); H01M 4/02 (2006.01); H01M 4/62 (2006.01); H01M 10/052 (2010.01); H01M 4/38 (2006.01);
U.S. Cl.
CPC ...
G01B 11/0641 (2013.01); H01M 4/382 (2013.01); H01M 4/62 (2013.01); H01M 10/052 (2013.01); H01M 2004/027 (2013.01); H01M 2220/20 (2013.01);
Abstract

A system for measuring a thickness of a coating arranged on an anode substrate includes an optical measurement system configured to transmit a light signal having a known first polarization toward the anode substrate through the coating such that the light signal is reflected from the surface of the anode substrate, a detection module positioned to receive the reflected light signal and configured to determine a second polarization of the reflected light signal that is different from the first polarization and measure a polarization difference between the first polarization and the second polarization, and a measurement module configured to receive the measured polarization difference, calculate the thickness of the coating based on the measured polarization difference, and generate an output based on the calculated thickness.


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