The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2023

Filed:

May. 10, 2022
Applicant:

Aktina Corp., Congers, NY (US);

Inventor:

Nicholas G. Zacharopoulos, West Nyack, NY (US);

Assignee:

Aktina Corp., Congers, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61N 5/10 (2006.01);
U.S. Cl.
CPC ...
A61N 5/1081 (2013.01); A61N 5/1049 (2013.01); A61N 5/1067 (2013.01); A61N 5/1075 (2013.01);
Abstract

Radiation beam alignment for a LINAC including (1) for each beam alignment parameter value of a set: (a) with a beam alignment parameter of a LINAC set to the beam alignment parameter value, using a gantry to generate a radiation beam; (b) using an imaging device to acquire a radiation transmission image indicative of a radiation field of the radiation beam after passing by a radiation opaque marker; (c) determining a location of a beam axis of the radiation beam and a center of a shadow of the marker based on the radiation transmission image; and (d) determining a target-to-beam-axis distance between the location of the beam axis and the center of the shadow of the radiation opaque marker; and (2) determining an optimum beam alignment parameter value based on the beam alignment parameter values and the target-to-beam-axis distances determined with the LINAC set to the beam alignment parameter values.


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