The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 26, 2023
Filed:
May. 05, 2015
Koninklijke Philips N.v., Eindhoven, NL;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
The present invention relates to a device () for modifying an imaging of a TEE probe in X-ray data, a medical imaging system () for modifying an imaging of a TEE probe in X-ray data, a method for modifying an imaging of a TEE probe in X-ray data, a computer program element for controlling such device () and a computer readable medium having stored such computer program element. The device () comprises an X-ray data provision unit (), a model provision unit (), a position locating unit (), and a processing unit (). The X-ray data provision unit () is configured to provide X-ray data comprising image data of a TEE probe. The model provision unit () is configured to provide model data of the TEE probe. The position locating unit () is configured to locate a position of the TEE probe in the X-ray data based on the model data of the TEE probe. The processing unit () is configured to define a region in a predetermined range adjacent to the TEE probe as reference area. The processing unit () is configured to process the X-ray data of the reference area into estimated X-ray data of a region occupied by the TEE probe. The processing unit () is configured to modify the X-ray data in the region occupied by the TEE probe based on the estimated X-ray data.