The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 26, 2023
Filed:
Apr. 28, 2017
Applicant:
Maxell, Ltd., Kyoto, JP;
Inventors:
Yukie Hiratsuka, Tokyo, JP;
Chiyo Ohno, Tokyo, JP;
Assignee:
MAXELL, LTD., Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/378 (2021.01); A61B 5/38 (2021.01); A61B 5/384 (2021.01); A61B 5/00 (2006.01); A61B 5/372 (2021.01); A61B 5/291 (2021.01);
U.S. Cl.
CPC ...
A61B 5/378 (2021.01); A61B 5/0006 (2013.01); A61B 5/291 (2021.01); A61B 5/372 (2021.01); A61B 5/384 (2021.01); A61B 5/6803 (2013.01); A61B 5/6815 (2013.01); A61B 5/742 (2013.01); A61B 5/749 (2013.01); A61B 2560/0487 (2013.01);
Abstract
An electronic device to acquire and analyze electroencephalogram data of the subject includes a cognitive function examination control section that presents examination data used for a cognitive function examination of the subject at the time of executing an operation having a different purpose from that of an electroencephalogram measurement, and a cognitive function analysis section that extracts an index of a cognitive function of the subject from electroencephalogram data of the subject measured when presenting examination data.