The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 19, 2023

Filed:

May. 11, 2021
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Yan Zhou, San Diego, CA (US);

Jung Ho Ryu, Fort Lee, NJ (US);

Qian Zhang, Basking Ridge, NJ (US);

Navid Abedini, Basking Ridge, NJ (US);

Tao Luo, San Diego, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 5/14 (2006.01); H04B 7/06 (2006.01); H04W 24/10 (2009.01); H04W 72/044 (2023.01); H04W 72/21 (2023.01);
U.S. Cl.
CPC ...
H04B 7/0695 (2013.01); H04L 5/14 (2013.01); H04W 24/10 (2013.01); H04W 72/046 (2013.01); H04W 72/21 (2023.01);
Abstract

Aspects described herein relate to autonomously measuring one or more new candidate beam pairs during configured resources to determine measurement results for the one or more new candidate beam pairs, where the configured resources can be configured for uplink communications or measurement gaps for transmitting signals to measure candidate beams. A measurement result or an indication of at least one new candidate beam pair can be reported based on a measurement result for the at least one new candidate beam pair of the one or more new candidate beam pairs.


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