The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 19, 2023

Filed:

Aug. 16, 2023
Applicant:

Apogee Semiconductor, Inc., Plano, TX (US);

Inventors:

David A. Grant, London, GB;

Mark Hamlyn, Murphy, TX (US);

Assignee:

Apogee Semiconductor, Inc., Plano, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K 19/23 (2006.01); H03K 19/003 (2006.01);
U.S. Cl.
CPC ...
H03K 19/23 (2013.01); H03K 19/003 (2013.01);
Abstract

An integrated circuit for use in high-reliability electronic systems contains one or more digital majority voters with corresponding disagreement detectors connected to the same input signals producing a majority value output and an error signal that is active when not all input signals agree. Internal error signals from multiple majority voter/disagreement detectors as well as external error inputs may be combined using disjunctive error logic to produce an 'error detected' output indication. Cold-sparing and hot-plugging are supported by providing cold-sparable electrostatic discharge protection circuits and power-on reset circuitry controlling cold-sparable output stages. Internal modular redundancy provides immunity to single-event transients as well as enhanced reliability. Redundant electronic systems using the majority voter with error detection are also provided, as are fault notification systems that use the disjunctive error logic and external error input feedthrough capabilities of serially-connected integrated circuits to produce an error indication for a plurality of subsystems.


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