The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 19, 2023
Filed:
Mar. 29, 2021
Michael H. Wood, Detroit, MI (US);
Michael H. Wood, Detroit, MI (US);
Abstract
A clinical event outcome scoring system and method are used to determine a Severity of Illness Clinical Key (SICK) score, which is a probable degree of successful outcome for a patient about to undergo a specific clinical event, such as for example, coronary bypass surgery, hip replacement, bariatric surgery, discharge from a hospital for home recovery, a course of chemotherapy, radiation, or other treatment protocol. The system and method analyzes historical patient data to generate a statistical model for each specific clinical event of interest, which can then be used to determine a SICK score for a patient about to undergo the same clinical event. In some embodiments, the statistical model can be 'fine-tuned' to render subcategories of statistical models tailored for certain patient populations about to undergo the same clinical event. In some embodiments, the statistical model can be augmented to take into account “outliers,” who have extra challenges not taken into account with the primary statistical model.