The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 19, 2023

Filed:

Dec. 17, 2020
Applicant:

Shanghai United Imaging Healthcare Co., Ltd., Shanghai, CN;

Inventors:

Wenjing Cao, Shanghai, CN;

Haohua Sun, Shanghai, CN;

Liyi Zhao, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/00 (2006.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
G06T 5/002 (2013.01); G06T 11/005 (2013.01); G06T 11/006 (2013.01); G06T 11/008 (2013.01); G06T 2211/424 (2013.01); G06T 2211/436 (2013.01);
Abstract

The present disclosure relates to systems and methods for image reconstruction. The system may obtain an initial image to be processed. The system may generate a reconstructed image by performing a plurality of iteration steps on the initial image. Each of the plurality of iteration steps may include a first optimization operation and at least one second optimization operation. The first optimization operation and the at least one second optimization operation may be executed sequentially. The first optimization operation may include receiving an image to be processed in the iteration step and determining an updated image by preliminarily optimizing the image to be processed. The at least one second optimization operation may include determining an optimized image by reducing interference information of the updated image and designating the optimized image as a next image to be processed in a next iteration step. The interference information may include noise information and/or artifact information.


Find Patent Forward Citations

Loading…