The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 19, 2023

Filed:

May. 04, 2018
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Sorin Faibish, Newton, MA (US);

Philippe Armangau, Acton, MA (US);

James M. Pedone, Jr., West Boylston, MA (US);

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2023.01); G06F 3/06 (2006.01); G06N 5/04 (2023.01); G06T 7/13 (2017.01); G06N 20/00 (2019.01); G06V 10/82 (2022.01); G06N 5/046 (2023.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06F 3/0653 (2013.01); G06N 5/046 (2013.01); G06N 20/00 (2019.01); G06T 7/13 (2017.01); G06V 10/82 (2022.01);
Abstract

A method is used in analyzing a storage system using a machine learning system. Data gathered from information associated with operations performed in a storage system is analyzed. The storage system is comprised of a plurality of components. A bitmap image is created based on the gathered data, where at least one of the plurality of components is represented in the bitmap image. The machine learning system is trained using the bitmap image, where the bitmap image is organized to depict the plurality of components of the storage system.


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Faibish, Sorin. (2023). Analyzing storage systems using machine learning systems (U.S. Patent No. 11847558). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11847558

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