The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 19, 2023

Filed:

Jul. 17, 2019
Applicant:

Vmware, Inc., Palo Alto, CA (US);

Inventors:

Bin Zan, Santa Clara, CA (US);

Zhen Mo, Sunnyvale, CA (US);

Vijay Ganti, Fremont, CA (US);

Vamsi Krishna Akkineni, Los Gatos, CA (US);

Assignee:

VMware, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/455 (2018.01); G06F 17/16 (2006.01); G06N 20/00 (2019.01); G06F 18/2415 (2023.01);
U.S. Cl.
CPC ...
G06F 9/45558 (2013.01); G06F 17/16 (2013.01); G06F 18/2415 (2023.01); G06N 20/00 (2019.01); G06F 2009/45591 (2013.01);
Abstract

A feature selection methodology is disclosed. In a computer-implemented method, components of a computing environment are automatically monitored, and have a feature selection analysis performed thereon. Provided the feature selection analysis determines that features of the components are well defined, a classification of the features is performed. Provided the feature selection analysis determines that features of the components are not well defined, a similarity analysis of the features is performed. Results of the feature selection methodology are generated.


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