The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 19, 2023
Filed:
Jun. 30, 2021
Micro Focus Llc, Santa Clara, CA (US);
Micro Focus LLC, Santa Clara, CA (US);
Abstract
Quality indicators regarding a software project under development that has a plurality of functional areas are collected. Each quality indicator is normalized to a coverage of the functional area of the software project to which the quality indicator corresponds. The normalized quality indicators are correlated to previously identified anomalies of the software project, yielding an anomaly indicative value for each normalized quality indicator corresponding to a probability that the normalized quality indicator is revelatory of unidentified anomalies of the software project. A normal behavior for each normalized quality indicator is estimated. For each functional area of the software project, an anomaly score indicative of a likelihood of an unidentified anomaly within the functional area is calculated. The anomaly score is based on, for each normalized quality indicator corresponding to the functional area, how the normalized quality indicator departs from its estimated normal behavior as weighted by its anomaly indicative value.