The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 19, 2023
Filed:
Sep. 08, 2021
Oracle International Corporation, Redwood Shores, CA (US);
Padmanabhan Krishnan, Brisbane, AU;
Yang Zhao, St. Lucia, AU;
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
A method may include detecting a first sub-flow, by executing a local defect analysis on code starting at a sink instruction, to a load instruction performing reading a first value using a first variable. The first sub-flow may include a first label of a first defect. The method may further include detecting a second sub-flow, by executing the local defect analysis on the code starting at a store instruction, to a load instruction performing writing a second value using a second variable. The second sub-flow may include a second label of a second defect. The method may further include determining that the first variable and the second variable are potential aliases by determining that the first label matches the second label, and obtaining, based on determining that the first variable and the second variable are potential aliases, a nonlocal flow by connecting the first sub-flow and the second sub-flow.