The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 19, 2023
Filed:
May. 17, 2023
Sas Institute Inc., Cary, NC (US);
Kevin L. Scott, Raleigh, NC (US);
Deovrat Vijay Kakde, Cary, NC (US);
Arin Chaudhuri, Raleigh, NC (US);
Sergiy Peredriy, Raleigh, NC (US);
SAS INSTITUTE, INC., Cary, NC (US);
Abstract
Anomalies in a target object can be detected and diagnosed using improved Mahalanobis-Taguchi system (MTS) techniques. For example, an anomaly detection and diagnosis (ADD) system can receive a set of measurements associated with attributes of a target object. A Mahalanobis distance (MD) can be determined using a generalized inverse matrix. An abnormal condition can be detected when the MD is greater than a predetermined threshold value. The ADD system can determine an importance score for each measurement of a corresponding attribute. The attribute whose measurement has the highest importance score can be determined to be responsible for the abnormal condition.