The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 19, 2023

Filed:

Jul. 08, 2020
Applicant:

Korea Institute of Science and Technology, Seoul, KR;

Inventors:

Maesoon Im, Seoul, KR;

Byung Chul Lee, Seoul, KR;

Young Jun Yoon, Seoul, KR;

Jin Soo Park, Seoul, KR;

Seung Min Kwak, Seoul, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03F 7/004 (2006.01); A61N 1/05 (2006.01); A61B 5/24 (2021.01);
U.S. Cl.
CPC ...
G03F 7/0041 (2013.01); A61B 5/24 (2021.01); A61N 1/0529 (2013.01); A61B 2562/125 (2013.01);
Abstract

Disclosed is a method for manufacturing a high-density neural probe including needles having various forms. The method, in which only a photolithography process and an etching process are used, simplifies a manufacturing process of the neural probe, minimizes changes in the characteristics of the neural probe depending on process equipment or conditions, and may thus ensure a high yield, thereby being advantageous in terms of commercialization. In addition, various forms of needles may be manufactured depending on the shape of patterns included in a mask, the height of the needles may be controlled by adjusting the size of the patterns and the gap between the patterns, and thereby, a neural probe having a plurality of needles having different heights may be manufactured.


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