The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 19, 2023
Filed:
Aug. 21, 2019
Applicant:
Fanuc Corporation, Yamanashi, JP;
Inventors:
Assignee:
FANUC CORPORATION, Yamanashi, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 17/36 (2006.01); G01S 7/35 (2006.01); G01S 7/497 (2006.01); G01S 17/48 (2006.01); G01S 17/88 (2006.01); G01S 7/4915 (2020.01); G01S 17/894 (2020.01);
U.S. Cl.
CPC ...
G01S 17/36 (2013.01); G01S 7/354 (2013.01); G01S 7/497 (2013.01); G01S 7/4915 (2013.01); G01S 17/48 (2013.01); G01S 17/88 (2013.01); G01S 17/894 (2020.01);
Abstract
An object monitoring system includes means for determining an arrangement relationship between a monitoring area and an external object on a basis of a distance measurement value of the external object, and calculating an influence degree of the external object on an object distance measurement in the monitoring area in accordance with the determined arrangement relationship.