The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 19, 2023

Filed:

May. 13, 2020
Applicant:

Gen-probe Incorporated, San Diego, CA (US);

Inventors:

George T. Walker, San Diego, CA (US);

Matthias Merten, San Diego, CA (US);

Gary D. Lair, San Diego, CA (US);

Assignee:

GEN-PROBE INCORPORATED, San Diego, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/10 (2006.01); G01N 35/04 (2006.01); C12Q 1/6806 (2018.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01N 35/1011 (2013.01); C12Q 1/6806 (2013.01); G01N 35/00732 (2013.01); G01N 35/00871 (2013.01); G01N 35/04 (2013.01); G01N 35/1065 (2013.01); G01N 2035/00742 (2013.01); G01N 2035/00782 (2013.01); G01N 2035/00801 (2013.01); G01N 2035/0406 (2013.01); G01N 2035/046 (2013.01); G01N 2035/047 (2013.01); G01N 2035/0462 (2013.01); G01N 2035/0465 (2013.01); G01N 2035/0467 (2013.01); G01N 2035/0472 (2013.01);
Abstract

A conveyor assembly for transporting a carrier coupled to a receptacle to a processing station located within a housing of an instrument. The conveyor assembly includes a spur conveyor subassembly and a buffer conveyor subassembly for transporting the carrier from a host conveyor assembly to the spur conveyor subassembly. The spur conveyor subassembly includes (i) a rotatable diverter having at least one recess for receiving and moving the carrier between the buffer conveyor subassembly and the spur conveyor subassembly and (ii) a gripper configured to grasp the carrier and move it from the diverter to the processing position located within the housing of the instrument.


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