The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 19, 2023
Filed:
Aug. 29, 2019
Ecole Polytechnique Federale DE Lausanne (Epfl), Lausanne, CH;
Dimitris Perdios, Lausanne, CH;
Adrien Besson, Marseilles, FR;
Florian Martinez, Chavannes-près-Renens, CH;
Marcel Arditi, Aïre, CH;
Jean-Philippe Thiran, Granges, CH;
ECOLE POLYTECHNIQUE FEDERALE DE LAUSANNE (EPFL), Lausanne, CH;
Abstract
The present invention concerns an array processing image reconstruction method comprising: receiving a set of echo waveforms as measurements from the object of interest; defining a measurement model linking an unknown image of the object to the measurements; defining a data fidelity functional using the measurement model; defining a regularisation functional using a trained non-linear mapping, the regularisation functional comprising prior knowledge about the unknown image; defining an optimisation problem involving the data fidelity functional and the regularisation functional for obtaining a first image estimate of the unknown image; and solving the optimisation problem to obtain the first image estimate.