The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 19, 2023
Filed:
Nov. 17, 2020
Hyundai Motor Company, Seoul, KR;
Kia Motors Corporation, Seoul, KR;
Electronics and Telecommunications Research Institute, Daejeon, KR;
Ha Seung Seong, Daejeon, KR;
Ho Jin Lee, Daejeon, KR;
Il Min Lee, Daejeon, KR;
Ki Won Moon, Daejeon, KR;
Eui Su Lee, Sejong-si, KR;
Dong Woo Park, Sejong-si, KR;
Jeong Woo Park, Daejeon, KR;
Kyung Hyun Park, Daejeon, KR;
Hyun Soo Kim, Daejeon, KR;
HYUNDAI MOTOR COMPANY, Seoul, KR;
KIA MOTORS CORPORATION, Seoul, KR;
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE, Daejeon, KR;
Abstract
A measurement apparatus for measuring a coating amount of a slurry according to the present disclosure includes a light emitter configured to irradiate terahertz wave onto a release paper coated with the slurry, a light receiver configured to receive the terahertz wave, which is irradiated from the light emitter and passes through the release paper coated with the slurry, to obtain a power of the terahertz wave, and a calculating part configured to calculate a thickness of an electrode, formed from the slurry applied to the release paper, based on the power of the terahertz wave received by the light receiver.