The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 19, 2023
Filed:
Aug. 28, 2020
Panasonic Intellectual Property Management Co., Ltd., Osaka, JP;
Takanobu Ojima, Osaka, JP;
Hideto Motomura, Kyoto, JP;
Rina Akaho, Osaka, JP;
Yoshinori Matsui, Nara, JP;
Abstract
Provided are an inspection method, a program, and an inspection system capable of improving accuracy of inspecting a color of a surface of an object. The inspection method includes acquisition step and comparison step. Acquisition step is a step of acquiring a target image of a surface of an object obtained by an imaging system imaging the surface of the object illuminated by an illumination system. Comparison step is a step of comparing a color of an attention region on the target image with a color of a reference region. The reference region is a region of a reference image of a surface of a reference object as a reference of a color of the object, and a region corresponding to a combination of an incident angle of light from the illumination system and a reflection angle of light to the imaging system in the attention region.