The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 19, 2023
Filed:
Oct. 28, 2019
Samsung Electronics Co., Ltd., Suwon-si, KR;
Kostiantyn Morozov, Kyiv, UA;
Oleksandr Klimenkov, Kyiv, UA;
Dmytro Vavdiiuk, Kyiv, UA;
Ivan Safonov, Kyiv, UA;
Andrii But, Kyiv, UA;
Andrii Sukhariev, Kyiv, UA;
Ruslan Iermolenko, Kyiv, UA;
Serhii Iliukhin, Kyiv, UA;
Yaroslav Lavrenyuk, Kyiv, UA;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
A three-dimensional depth measuring method using a structured light camera comprising a first projector, a second projector, and an optical sensor, according to the present disclosure, comprises: a step in which a first light pattern is projected by the first projector; a step in which a second light pattern is projected by the second projector; a step of filtering, by a color filter, a third light pattern in which the first light pattern and the second light pattern reflected from an object overlap, so as to separate the third light pattern into a first filtered pattern and a second filtered pattern; a step of localizing the first filtered pattern and classifying first feature points of the first filtered pattern; a step of localizing the second filtered pattern and classifying second feature points of the second filtered pattern; and a step of obtaining position information of the object on the basis of the first feature points and the second feature points.