The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 19, 2023

Filed:

Jun. 10, 2019
Applicant:

Renishaw Plc, Wotton-under-Edge, GB;

Inventors:

John Charles Ould, Backwell Farleigh, GB;

Thomas Phillip Handford, Bristol, GB;

Assignee:

RENISHAW PLC, Wotton-Under-Edge, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/016 (2006.01); G01P 15/18 (2013.01); G01P 1/00 (2006.01);
U.S. Cl.
CPC ...
G01B 5/016 (2013.01); G01P 15/18 (2013.01); G01P 1/00 (2013.01);
Abstract

Method for measuring an object using a scanning probe carried by a machine tool having a probe holder for the scanning probe and a carrier for the object. The method includes (i) using the machine tool to move the probe holder relative to the carrier along a pre-programmed scan path, (ii) measuring acceleration whilst the pre-programmed scan path is traversed, (iii) collecting probe data whilst the pre-programmed scan path is traversed, and (iv) using the acceleration measured to identify at least one acceleration zone of the pre-programmed scan path and thereby determine one or more positions along the scan path at which the probe data of step (iii) were collected.


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