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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11845143 B1

PDFFull Text
Date of Patent:
Dec. 19, 2023

Filed:

Jul. 06, 2018

Optical design for a two-degree-of-freedom scanning system with a curved sample plane

Applicant:

University of Rochester, Rochester, NY (US);

Inventors:

Daniel R. Brooks, Rochester, NY (US);

Jonathan D. Ellis, Tuscon, AZ (US);

Assignee:

University of Rochester, Rochester, NY (US);

Attorneys:

Andrew J. Anderson, Esq.

Harter Secrest & Emery LLP

Primary Examiner:

Nathaniel E Wiehe

Assistant Examiner:

Theodore J Evangelista

Int. Cl.
CPC ...
B23K 26/082 (2014.01); B23K 26/0622 (2014.01); B23K 26/06 (2014.01); G02B 13/00 (2006.01); G02B 26/10 (2006.01); G02B 27/00 (2006.01);
U.S. Cl.
CPC ...
B23K 26/082 (2015.10); B23K 26/0624 (2015.10); B23K 26/0648 (2013.01); G02B 13/0005 (2013.01); G02B 13/0095 (2013.01); G02B 26/101 (2013.01); G02B 26/105 (2013.01); G02B 27/0031 (2013.01);
Abstract

A pre-objective two-degree-of-freedom galvanometer scanning system including two galvo mirrors () with an optical relay () between the mirrors () and a microscope objective () with a curved image plane () is presented. The second galvo mirror () is located in the aperture stop before the objective. The optical system enables scanning in both directions over the full, curved field for creating custom refractive structures across the 6.5 mm optical zone of contact lenses using femtosecond micro-modification.

Find Patent Forward Citations

Brooks, Daniel. (2023). Optical design for a two-degree-of-freedom scanning system with a curved sample plane (U.S. Patent No. 11845143). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11845143

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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