The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 19, 2023
Filed:
Oct. 29, 2021
GE Precision Healthcare Llc, Wauwatosa, WI (US);
Jiahua Fan, New Berlin, WI (US);
Ming Yan, Hartland, WI (US);
Jed Douglas Pack, Glenville, WI (US);
Priti Madhav, Brookfield, WI (US);
Kentaro Ogata, Hachioji, JP;
Ken Arai, Setagaya, JP;
GE Precision Healthcare LLC, Wauwatosa, WI (US);
Abstract
A method includes acquiring a first dataset of projection measurements at a first energy spectrum and a second dataset of projection measurements at a second energy spectrum different from the first energy spectrum by switching between acquiring the first dataset for a set number of consecutive views at different projection angles at the first energy spectrum and acquiring the second dataset for the set number of consecutive views at different projection angles at the second energy spectrum. The set number of consecutive views is greater than one. The method includes supplementing both the first dataset with estimated projection measurements at the first energy spectrum and the second dataset with estimated projection measurements at the second energy spectrum to provide missing projection measurements at different projection angles not acquired during the imaging scan for the first dataset and the second dataset.