The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 12, 2023

Filed:

Jan. 19, 2021
Applicant:

Asm Ip Holding B.v., Almere, NL;

Inventors:

Shiva K. T. Rajavelu Muralidhar, Tempe, AZ (US);

Sam Kim, Chandler, AZ (US);

Assignee:

ASM IP Holding B.V., Almere, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01K 1/14 (2006.01); H01K 7/00 (2006.01); H05B 3/44 (2006.01); F27B 17/00 (2006.01); H01L 21/324 (2006.01); H01L 21/67 (2006.01); H05B 3/00 (2006.01); F27D 5/00 (2006.01);
U.S. Cl.
CPC ...
H01L 21/67115 (2013.01); F27B 17/0025 (2013.01); H01K 1/14 (2013.01); H01K 7/00 (2013.01); H01L 21/324 (2013.01); H05B 3/0047 (2013.01); F27D 5/0037 (2013.01);
Abstract

An arrangement of linear heat lamps is provided which allows for localized control of temperature nonuniformities in a substrate during semiconductor processing. A reactor includes a substrate holder positioned between a top array and a bottom array of linear heat lamps. At least one lamp of the arrays includes a filament having a varying density and power output along the length of the lamp. In particular, at least one lamp of the arrays includes a filament having a higher filament winding density within a central portion of the lamp relative to peripheral portions of the lamp. In some embodiments, the at least one lamp is a central lamp extending across a central portion of the substrate heated by the lamp. Furthermore, at least one lamp of the arrays has a higher power output within a central portion of the lamp than at peripheral portions of the lamp.


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