The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 12, 2023
Filed:
Jan. 06, 2021
Hoya Corporation, Tokyo, JP;
Akihiko Nishide, Tokyo, JP;
HOYA CORPORATION, Tokyo, JP;
Abstract
Provided are an endoscope system, a processor, a diagnostic support method, and a computer program. A plurality of images are captured at different focal positions on an object, an evaluation value indicating a degree of focus is calculated for each of corresponding sub-regions among the plurality of captured images, a captured image including a sub-region having the highest degree of focus is determined among the plurality of captured images based on the calculated evaluation value, a distance to a region on the object corresponding to the sub-region is calculated, distance information is generated by calculating a distance to a plurality of regions on the object corresponding to the sub-region, a feature region is extracted from the captured image, diagnostic support information for the object is generated based on the distance information and a feature parameter associated with the feature region, and the generated diagnostic support information is output.