The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 12, 2023
Filed:
Sep. 30, 2021
Emc Ip Holding Company Llc, Hopkinton, MA (US);
Matthew Bryan, Olympia, WA (US);
EMC IP HOLDING COMPANY LLC, Hopkinton, MA (US);
Abstract
Phased parameterized combinatoric testing for a data storage system is disclosed. A testing recipe can be performed according to different input arguments. Combinatoric testing of the data storage system can be based on different combinations of operations and arguments. The disclosed testing can employ a consistent integer index for arguments passed into the sequenced operations of the recipe. The recipe can be employed to generate a phased test tree that can enable testing based on a phase rather than loading an entire test suite into memory. The consistent integer index can be used to identify failed test cases such that the entire test can be reconstituted from stored failed test information. Distribution of test cases to worker process can based on the phased test tree to facilitate interning an operation. Stored failed test information can include human-readable failure information.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile