The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 12, 2023

Filed:

Nov. 16, 2022
Applicant:

Sharp Semiconductor Innovation Corporation, Tenri, JP;

Inventors:

Isamu Kawabe, Tenri, JP;

Takahiro Inoue, Tenri, JP;

Takayuki Shimizu, Tenri, JP;

Kohji Hamaguchi, Tenri, JP;

Tetsuro Ikeda, Tenri, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 3/3225 (2016.01);
U.S. Cl.
CPC ...
G09G 3/3225 (2013.01); G09G 2360/144 (2013.01); G09G 2360/145 (2013.01); G09G 2360/16 (2013.01);
Abstract

A semiconductor device includes the following: a light measuring instrument disposed opposite the display surface of a display panel provided with a self-emission element, and disposed for measuring the ambient-light illuminance of the display panel; a storage device configured to store a plurality of first measurements measured by the light measuring instrument in synchronization with a synchronizing signal of the display panel during a plurality of first measurement periods that are shorter than an ON/OFF period of the self-emission element; and a calculation unit configured to calculate the light emission illuminance of the self-emission element in accordance with the plurality of first measurements stored in the storage device, and configured to calculate the ambient-light illuminance by subtracting a value based on the light emission illuminance from a second measurement measured by the light measuring instrument during a second measurement period that is longer than the plurality of first measurement periods.


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