The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 12, 2023
Filed:
Feb. 11, 2021
Applicant:
Nec Corporation, Tokyo, JP;
Inventors:
Tatsushi Yasuda, Tokyo, JP;
Satoru Ishii, Tokyo, JP;
Assignee:
NEC CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/246 (2017.01); H04N 7/18 (2006.01); G08B 13/196 (2006.01); G08B 25/08 (2006.01); G06T 7/12 (2017.01); G06V 20/52 (2022.01); G06T 7/10 (2017.01); G06T 1/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/246 (2017.01); G06T 1/0007 (2013.01); G06T 7/10 (2017.01); G06T 7/12 (2017.01); G06V 20/52 (2022.01); G08B 13/19606 (2013.01); G08B 13/19613 (2013.01); G08B 25/08 (2013.01); H04N 7/183 (2013.01); G06T 2207/30232 (2013.01);
Abstract
A monitoring apparatusincludes: a monitoring line setting unitthat sets a monitoring line in an image acquired from the image capturing unit; and an overlapping detection unitthat detects overlapping between an object in the image and the monitoring line. If overlapping is detected by the overlapping detection unit, the monitoring line setting unitsets a new monitoring line according to the object.