The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 12, 2023
Filed:
Mar. 28, 2023
Zhejiang University, Hangzhou, CN;
Kai Jin, Hangzhou, CN;
Juan Ye, Hangzhou, CN;
Zhiyuan Gao, Hangzhou, CN;
Xiaoyu Ma, Hangzhou, CN;
Yaqi Wang, Hangzhou, CN;
Yunxiang Li, Hangzhou, CN;
ZHEJIANG UNIVERSITY, Hangzhou, CN;
Abstract
Disclosed is a fundus image quality evaluation method based on multi-source and multi-scale feature fusion, comprising following steps: S, acquiring multi-source fundus images, labeling the multi-source fundus images with four evaluation dimensions of brightness, blur, contrast and overall image quality, and forming training samples with the fundus image and labeling labels; S, constructing a fundus image quality evaluation network including a feature extraction module, a fusion module, an attention module and an evaluation module; S, training the fundus image quality evaluation network by using training samples to obtain a fundus image quality evaluation model; and S: inputting fundus images to be measured into the fundus image quality evaluation model, and outputting quality evaluation results through calculation. Also provided is a fundus image quality evaluation device based on above method.