The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 12, 2023

Filed:

Jun. 09, 2021
Applicant:

Mayachitra, Inc., Santa Barbara, CA (US);

Inventors:

Chandrakanth Gudavalli, Santa Barbara, CA (US);

Michael Gene Goebel, Santa Barbara, CA (US);

Tejaswi Nanjundaswamy, Mountain View, CA (US);

Lakshmanan Nataraj, Chennai, IN;

Shivkumar Chandrasekaran, Santa Barbara, CA (US);

Bangalore S. Manjunath, Santa Barbara, CA (US);

Assignee:

Mayachitra, Inc., Santa Barbara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0002 (2013.01); G06T 2200/24 (2013.01); G06T 2207/10032 (2013.01); G06T 2207/20056 (2013.01);
Abstract

Systems and methods herein describe a metadata verification system that is configured to access a digital satellite image, generate a first discrete Fourier transform (DFT) pattern based on an ortho-rectified digital satellite image, generate a second DFT pattern based on rational polynomial coefficient (RPC) data of the digital satellite image, compare the first DFT pattern to the second DFT pattern, generate a score based on the comparison, and generate a determination of whether the digital satellite image has been manipulated based on the score.


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