The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 12, 2023

Filed:

Dec. 29, 2021
Applicant:

Nuvoton Technology Corporation, Hsinchu Science Park, TW;

Inventor:

Shun-Hsiung Chen, Hsinchu Science Park, TW;

Assignee:

NUVOTON TECHNOLOGY CORPORATION, Hsinchu Science Park, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/55 (2013.01); G06F 21/54 (2013.01); G06F 11/10 (2006.01); G06F 21/75 (2013.01); G06F 21/60 (2013.01);
U.S. Cl.
CPC ...
G06F 21/554 (2013.01); G06F 11/1004 (2013.01); G06F 11/1068 (2013.01); G06F 21/54 (2013.01); G06F 21/556 (2013.01); G06F 21/602 (2013.01); G06F 21/755 (2017.08);
Abstract

A parameter checking method includes substituting a plurality of initial parameters into a data integrity algorithm to obtain syndrome data using a processor, and using a hardware cipher to calculate a calculation result based on the data integrity algorithm based on a plurality of calculation parameters corresponding to the initial parameters. Moreover, when the processor determines that the syndrome data is not the same as the calculation result, the processor outputs a hacker attack message, indicating that at least one of the calculation parameters has been tampered with.


Find Patent Forward Citations

Chen, Shun-Hsiung. (2023). Parameter checking system and parameter checking method (U.S. Patent No. 11841944). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11841944

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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