The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 12, 2023
Filed:
Oct. 28, 2020
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Leica Microsystems CMS GmbH, Wetzlar, DE;
Abstract
An optical imaging device for a microscope comprises a first optical system configured to form a first optical image corresponding to a first region of a sample in accordance with a first imaging mode, a second optical system configured to form a second optical image corresponding to a second region of said sample, wherein said first and second regions spatially coincide in a target region of said sample and said first and second imaging modes are different from each other, a memory storing first distortion correction data suitable for correcting a first optical distortion caused by said first optical system in said first optical image, second distortion correction data suitable for correcting a second optical distortion caused by said second optical system in said second optical image, and transformation data suitable for correcting positional misalignment between said first and second optical images, and a processor which is configured to process first image data representing said first optical image based on said first distortion correction data for generating first distortion corrected image data, to process second image data representing said second optical image based on said second distortion correction data for generating second distortion corrected image data; and to combine said first and second distortion corrected image data based on said transformation data for generating combined image data representing a combined image which corresponds to said target region of said object.