The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 12, 2023

Filed:

Mar. 27, 2018
Applicant:

Schlumberger Technology Corporation, Sugar Land, TX (US);

Inventors:

Vasileios-Marios Gkortsas, Boston, MA (US);

Lalitha Venkataramanan, Lexington, MA (US);

Jean-Marc Donadille, Clamart, FR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/38 (2006.01); G01V 3/22 (2006.01); G01V 3/32 (2006.01); G01V 3/34 (2006.01);
U.S. Cl.
CPC ...
G01V 3/22 (2013.01); G01V 3/32 (2013.01); G01V 3/34 (2013.01);
Abstract

Methods are provided for determining values for a set of parameters for multiple locations in a formation by inversion of formation data obtained from a plurality of different logging tools. The inversion of the formation data is constrained by certain formation data that characterizes each particular location in the formation as obtained from at least one of the plurality of different logging tools. In one embodiment, the set of parameters for each particular location in the formation includes an apparent cementation factor mand a formation water saturation S, which can be derived by inverting dielectric data that characterizes the particular location in the formation as obtained from a dielectric logging tool. The methods can also be adapted to characterize a porous medium such as reservoir rock, particular with regard to laboratory analysis of porous media samples.


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Gkortsas, Vasileios-Marios. (2023). Methods and systems of determining parameters characterizing porous media from data gathered by a plurality of different tools (U.S. Patent No. 11841476). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11841476

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