The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 12, 2023

Filed:

May. 08, 2018
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Taichi Tanaka, Tokyo, JP;

Daisuke Ikefuji, Tokyo, JP;

Osamu Hoshuyama, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 13/90 (2006.01); G01S 7/04 (2006.01);
U.S. Cl.
CPC ...
G01S 13/9005 (2013.01); G01S 7/046 (2013.01); G01S 13/9027 (2019.05); G01S 13/9056 (2019.05);
Abstract

A synthetic aperture radar image analysis systemincludes: a phase correlation determination meanswhich determines a strength of the phase correlation between a plurality of pixels in an image selected from among a plurality of images on the basis of the plurality of images that have been photographed by a synthetic aperture radar and show the same point; a shape determination meanswhich determines a degree of similarity between the shape of the distribution of the plurality of pixels and an object shape indicated by geospatial information; and an association meanswhich associates the plurality of pixels with the object on the basis of the determined strength of the phase correlation and the determined degree of similarity.


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