The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 12, 2023
Filed:
Jul. 28, 2022
National Technology & Engineering Solutions of Sandia, Llc, Albuquerque, NM (US);
Peter Schwindt, Albuquerque, NM (US);
Joonas Aleksanteri Iivanainen, Albuquerque, NM (US);
Tony Ray Carter, Albuquerque, NM (US);
Amir Borna, Albuquerque, NM (US);
National Technology & Engineering Solutions of Sandia, LLC, Albuquerque, NM (US);
Abstract
An atomic magnetometer, and a method for using same is disclosed. The method for measuring an ambient magnetic field uses an atomic magnetometer that has a probe light beam with a probe axis that probes a polarization vector of an atomic population confined within a vapor cell. The method employs one or more measurement cycles. In each measurement cycle, the polarization vector is prepared in an initial state via an optical pumping pulse. The vapor cell is then subjected to the ambient magnetic field, which results in rotation of the polarization vector by Larmor precession. Within the measurement cycle, at a point in time after the polarization vector has been prepared in the initial state, the ambient magnetic field rotates the direction of the polarization vector, and at least one measurement is made of a projection of the Larmor-rotated polarization vector onto the probe axis during or after application of a magnetic waveform.