The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 12, 2023
Filed:
Sep. 15, 2017
Keysight Technologies, Inc., Santa Rosa, CA (US);
Hansjoerg Haisch, Altdorf, DE;
Andy Doberstein, Ahrensburg, DE;
EYSIGHT TECHNOLOGIES, INC., Santa Rosa, CA (US);
Abstract
A test apparatus and a method for operating a data processing system to generate a test signal for testing a DUT are disclosed. The apparatus includes a signal generator, artificial neural network, and controller. The signal generator generates a test signal determined by a plurality of signal generator input parameters, X, that are coupled thereto. The test signal is characterized by a plurality of calculated parameters, Y. The artificial neural network has the calculated parameters as inputs and a plurality of outputs connected to the plurality of signal generator inputs. The controller receives desired values for the calculated parameters and couples those desired values to the neural network inputs, thereby causing the test signal generator to generate a test signal having the desired values for the calculated parameters.