The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 12, 2023

Filed:

Apr. 18, 2023
Applicant:

Contemporary Amperex Technology Co., Limited, Fujian, CN;

Inventors:

Guoda Huang, Fujian, CN;

Weizhi Zhou, Fujian, CN;

Yuanfu Chen, Fujian, CN;

Qingqing Song, Fujian, CN;

Kai Cui, Fujian, CN;

Minjiang Xu, Fujian, CN;

Yiruo Wang, Fujian, CN;

Gang Lin, Fujian, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/04 (2006.01); G01N 21/892 (2006.01);
U.S. Cl.
CPC ...
G01N 21/892 (2013.01); G01B 11/043 (2013.01); G01N 2201/126 (2013.01);
Abstract

A method and a device for testing an electrode sheet, the method may comprise: acquiring M pieces of test data of a tab, wherein the tab protrudes from the end face of the electrode sheet along the first direction, the M pieces of test data are the test data of the tab at M consecutive positions along the second direction, the M pieces of test data are the test data of the height of the tab in the first direction, the second direction is perpendicular to the first direction, and M is a positive integer greater than 1; and determining whether the shape of the tab is normal based on the M pieces of test data.


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