The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 12, 2023

Filed:

Mar. 24, 2020
Applicants:

Ricoh Company, Ltd., Tokyo, JP;

Fanuc Corporation, Yamanashi, JP;

Inventors:

Yu Teshima, Kanagawa, JP;

Yasuhiro Nakahama, Yamanashi, JP;

Assignees:

RICOH COMPANY, LTD., Tokyo, JP;

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 99/00 (2011.01); G06Q 50/04 (2012.01); G01H 17/00 (2006.01); G05B 19/4065 (2006.01);
U.S. Cl.
CPC ...
G01M 99/005 (2013.01); G01H 17/00 (2013.01); G05B 19/4065 (2013.01); G06Q 50/04 (2013.01); G05B 2219/50206 (2013.01);
Abstract

A diagnosis device includes a first acquisition unit, a second acquisition unit, and an associating unit. The first acquisition unit is configured to acquire, from a machine tool, context information including at least a monitoring specifying number identifying a machining process. The second acquisition unit is configured to acquire detection information output from a detection unit installed for the machine tool. The associating unit is configured to associate the monitoring specifying number included in the context information acquired by the first acquisition unit and the detection information acquired by the second acquisition unit.


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