The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 12, 2023
Filed:
Feb. 01, 2022
Si-ware Systems, Cairo, EG;
Yasser M. Sabry, Cairo, EG;
Bassem A. Mortada, Cairo, EG;
Khaled Hassan, Cairo, EG;
Abdelrahman Ahmed Maher Mohamed Elsayed Salem, Cairo, EG;
Diaa Khalil, Cairo, EG;
Mohamed H. Al Haron, Cairo, EG;
Mohammed Ahmed Elsheikh, Cairo, EG;
Ahmed Shebl, Cairo, EG;
Bassam Saadany, Cairo, EG;
Mostafa Medhat, Cairo, EG;
Botros George Iskander Shenouda, Cairo, EG;
SI-WARE SYSTEMS, Cairo, EG;
Abstract
Aspects relate to a compact material analyzer including a light source, a detector, and a module including a first optical window on a first side of the module, a second optical window on a second side of the module opposite the first side, and a light modulator. The light source produces input light at a high power that is passed through the first optical window to the light modulator. The light modulator is configured to attenuate the input light, produce modulated light based on the input light, and direct the modulated light through the second optical window to the sample. The modulated light produced by the light modulator is at a lower power safe for the sample. The detector is configured to receive output light from the sample produced from interaction with the modulated light through the second optical window and to detect a spectrum of the output light.