The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 12, 2023

Filed:

Apr. 14, 2021
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Genki Cho, Kanagawa, JP;

Hiroto Oka, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B25J 9/16 (2006.01); G06V 20/10 (2022.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
B25J 9/1653 (2013.01); B25J 9/1697 (2013.01); G06T 7/0004 (2013.01); G06V 20/10 (2022.01);
Abstract

An image processing apparatus capable of analyzing a cause of an abnormality of a system efficiently. The image processing apparatus includes a monitoring unit and an analysis unit. The monitoring unit monitors a monitoring object to detect occurrence of an abnormality in the monitoring object by applying an image process to a first area in each of images of the monitoring object that are photographed at different time points. The analysis unit analyzes a cause of an abnormality detected by the monitoring unit by applying an image process to a second area that is different from the first area in an image of a time point preceding a time point at which the abnormality is detected.


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