The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 12, 2023
Filed:
Oct. 29, 2018
Applicant:
Koninklijke Philips N.v., Eindhoven, NL;
Inventors:
Gary Cheng-How Ng, Redmond, WA (US);
Deborah Kim, Bothell, CA (US);
Assignee:
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 8/08 (2006.01); A61B 8/00 (2006.01); A61B 90/00 (2016.01);
U.S. Cl.
CPC ...
A61B 8/085 (2013.01); A61B 8/0825 (2013.01); A61B 8/4245 (2013.01); A61B 8/4416 (2013.01); A61B 8/463 (2013.01); A61B 8/468 (2013.01); A61B 8/5223 (2013.01); A61B 8/5261 (2013.01); A61B 90/39 (2016.02); A61B 2090/3954 (2016.02);
Abstract
The present disclosure describes ultrasound imaging systems and methods that may be used to assist clinicians in locating lesions during an ultrasound exam that were previously located from images acquired by another imaging system, for example, a magnetic resonance imaging system. A lesion location interface is disclosed that provides visual indications of predicted lesion locations on a display. The predicted lesion locations may be determined by a deformation model included in an ultrasound imaging system as disclosed herein.