The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2023

Filed:

Jan. 27, 2022
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Tetsuya Itano, Kanagawa, JP;

Tatsuya Ryoki, Kanagawa, JP;

Yu Arishima, Kanagawa, JP;

Taro Muraki, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 25/671 (2023.01); H04N 25/75 (2023.01); H04N 25/60 (2023.01);
U.S. Cl.
CPC ...
H04N 25/671 (2023.01); H04N 25/60 (2023.01); H04N 25/75 (2023.01);
Abstract

Since a failure related to an output from a sensor is not detected from an image signal and a failure of the sensor is not detected from an output from the sensor in a system including the sensor for abnormality detection, it is not possible to perform the abnormality detection and to indicate the abnormality to the outside of the system. An apparatus includes a pixel area including multiple pixels, multiple sensors, a processing unit that compares signals based on outputs from the multiple sensors with each other, an output unit that outputs information based on a result of comparison.


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